Erscheinungsdatum: 12.11.2008

<P>XPS, UPS and AES as techniques for surface chemical composition analysis</P>

XPS, UPS and AES as techniques for surface chemical composition analysis

We will present an overview of the most common kinds of electron spectroscopy ( namely XPS, UPS and AES) and highlight the strengths and limitations of these surface characterization methods.

Experimental results obtained on inorganic material, polymers and biomaterials will be presented to illustrate the application potential for all these surface characterization methods.

A. Lyapin, G. Coustou

Physical Electronics GmbH, Ismaning

Termin:

Donnerstag, 13.11.2008, 17.00 Uhr, Raum C 5

Experimente im Bereich Oberflächenanalytik Experimente im Bereich Oberflächenanalytik